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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Fearn, Sarah

Omschrijving

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

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Schrijver: Fearn, Sarah
Titel: An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Uitgever: Morgan & Claypool Publishers

Jaar: 2015
Taal: Engels
Pagina's: 66
Gewicht: 204 gr

EAN: 9781681740249
Afmetingen: 254 x 178 x 6 mm
Bindwijze: Paperback

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Fearn, Sarah

Omschrijving

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